speaker: Michel Dupanloup, IPNL, Lyon, FRANCE
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to be submitted
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The APVD circuit, developed in the 0.8 micron radiation hard SOI DMILL  technology from ATMEL/TEMIC-MHS Nantes for the front-end electronics of  the CMS tracker, has been irradiated using a 10KeV Xray beam to total doses of up to 20 Mrad. 

The main performances of the APVD like gain, pulse shape, noise, are presented as a function of the radiation dose. In particular, we investigated  the possible non-linearity of the internal DAC to control the correct biasing of the circuit via the I2C protocol. 
        
The full functionality of the circuit is preserved after irradiation confirming the hardness of both the DMILL technology and the APVD design.
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